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Excitation power dependent photoluminescence characterization of insulator-semiconductor interfaces on near surface quantum structures passivated by silicon interface control layer technology
Excitation power dependent photoluminescence characterization of insulator-semiconductor interfaces on near surface quantum structures passivated by silicon interface control layer technology
Excitation power dependent photoluminescence characterization of insulator-semiconductor interfaces on near surface quantum structures passivated by silicon interface control layer technology
Hasegawa, H. (author) / Kodama, S. (author) / Ikeya, K. (author) / Fujikura, H. (author)
APPLIED SURFACE SCIENCE ; 117/118 ; 710-713
1997-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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