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Characterization of Deep Levels in SiC by Photoluminescence Spectroscopy and Mapping
Characterization of Deep Levels in SiC by Photoluminescence Spectroscopy and Mapping
Characterization of Deep Levels in SiC by Photoluminescence Spectroscopy and Mapping
Tajima, M. (author) / Kumagaya, Y. (author) / Nakata, T. (author) / Inoue, M. (author) / Nakamura, A. (author) / Pensl, G. / Morkoc, H. / Monemar, B. / Janzen, E.
1998-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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