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High Temperature X-Ray Diffraction Studies of the Phase Formation Process of Iridium Silicide Thin Films
High Temperature X-Ray Diffraction Studies of the Phase Formation Process of Iridium Silicide Thin Films
High Temperature X-Ray Diffraction Studies of the Phase Formation Process of Iridium Silicide Thin Films
Kurt, R. (author) / Pitschke, W. (author) / Heinrich, A. (author) / Wetzig, K. (author)
MATERIALS SCIENCE FORUM ; 278/281 ; 448-453
1998-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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