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    Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy

    New search for: Krok, F.
    New search for: Kolodziej, J.
    New search for: Such, B.
    New search for: Piatkowski, P.
    New search for: Szymonski, M.

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    Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy

    New search for: Krok, F.
    New search for: Kolodziej, J.
    New search for: Such, B.
    New search for: Piatkowski, P.
    New search for: Szymonski, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy

    New search for: Krok, F.
    New search for: Kolodziej, J.
    New search for: Such, B.
    New search for: Piatkowski, P.
    New search for: Szymonski, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Ion beam-induced nanostructuring of AIIIBV semiconductor surfaces studied with dynamic force microscopy and Kelvin probe force spectroscopy

    Contributors:

    Krok, F. (author) / Kolodziej, J. (author) / Such, B. (author) / Piatkowski, P. (author) / Szymonski, M. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 210 ; 112-116

    Publication date:

    2003-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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