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Characterization of Polycrystalline SiC Grown on SiO~2 and Si~3N~4 by APCVD for MEMS Applications
Characterization of Polycrystalline SiC Grown on SiO~2 and Si~3N~4 by APCVD for MEMS Applications
Characterization of Polycrystalline SiC Grown on SiO~2 and Si~3N~4 by APCVD for MEMS Applications
Wu, C.-H. (author) / Zorman, C. A. (author) / Mehregany, M. (author)
MATERIALS SCIENCE FORUM ; 338/342 ; 541-544
2000-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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