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    Observation of Deep Levels in SiC by Optical-Isothermal Capacitance Transient Spectroscopy

    New search for: Kobayashi, S.
    New search for: Imai, S.
    New search for: Hayami, Y.
    New search for: Kushibe, M.
    New search for: Shinohe, T.
    New search for: Okushi, H.

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    Observation of Deep Levels in SiC by Optical-Isothermal Capacitance Transient Spectroscopy

    New search for: Kobayashi, S.
    New search for: Imai, S.
    New search for: Hayami, Y.
    New search for: Kushibe, M.
    New search for: Shinohe, T.
    New search for: Okushi, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Observation of Deep Levels in SiC by Optical-Isothermal Capacitance Transient Spectroscopy

    New search for: Kobayashi, S.
    New search for: Imai, S.
    New search for: Hayami, Y.
    New search for: Kushibe, M.
    New search for: Shinohe, T.
    New search for: Okushi, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Observation of Deep Levels in SiC by Optical-Isothermal Capacitance Transient Spectroscopy

    Contributors:

    Kobayashi, S. (author) / Imai, S. (author) / Hayami, Y. (author) / Kushibe, M. (author) / Shinohe, T. (author) / Okushi, H. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 338/342 ; 757-760

    Publication date:

    2000-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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