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    Enhancement of Ag electromigration resistance by a novel encapsulation process

    New search for: Zeng, Y.
    New search for: Chen, L.
    New search for: Zou, Y. L.
    New search for: Nyugen, P. A.
    New search for: Hansen, J. D.
    New search for: Alford, T. L.

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    Enhancement of Ag electromigration resistance by a novel encapsulation process

    New search for: Zeng, Y.
    New search for: Chen, L.
    New search for: Zou, Y. L.
    New search for: Nyugen, P. A.
    New search for: Hansen, J. D.
    New search for: Alford, T. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Enhancement of Ag electromigration resistance by a novel encapsulation process

    New search for: Zeng, Y.
    New search for: Chen, L.
    New search for: Zou, Y. L.
    New search for: Nyugen, P. A.
    New search for: Hansen, J. D.
    New search for: Alford, T. L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Enhancement of Ag electromigration resistance by a novel encapsulation process

    Contributors:

    Zeng, Y. (author) / Chen, L. (author) / Zou, Y. L. (author) / Nyugen, P. A. (author) / Hansen, J. D. (author) / Alford, T. L. (author)

    Published in:

    MATERIALS LETTERS ; 45 ; 157-161

    Publication date:

    2000-01-01

    Size:

    5 pages

    ISSN:

    0167-577X

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1105 / 530

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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