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Transmission Electron Microscopy Studies of Oxidation of Single Crystal Silicon Carbide at High Temperature
Transmission Electron Microscopy Studies of Oxidation of Single Crystal Silicon Carbide at High Temperature
Transmission Electron Microscopy Studies of Oxidation of Single Crystal Silicon Carbide at High Temperature
Chayasombat, B. (author) / Tarumi, N. (author) / Kato, T. (author) / Hirayama, T. (author) / Sasaki, K. (author) / Kuroda, K. (author) / Chang, Y.W. / Kim, N.J. / Lee, C.S.
2007-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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