Hydrogen-related effects in GaInP/GaAs HBTs: incorporation, removal and influence on device reliability: Fid-Bau Portal

Hydrogen-related effects in GaInP/GaAs HBTs: incorporation, removal and influence on device reliability

Cassette, S. / Delage, S. L. / Chartier, E. / Floriot, D. / Poisson, M. A. / Garcia, J. C. / Grattepain, C. / Mimila Arroyo, J. / Plana, R. / Bland, S. W.

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Hydrogen-related effects in GaInP/GaAs HBTs: incorporation, removal and influence on device reliability

Cassette, S. / Delage, S. L. / Chartier, E. / Floriot, D. / Poisson, M. A. / Garcia, J. C. / Grattepain, C. / Mimila Arroyo, J. / Plana, R. / Bland, S. W.

Hydrogen-related effects in GaInP/GaAs HBTs: incorporation, removal and influence on device reliability

Cassette, S. / Delage, S. L. / Chartier, E. / Floriot, D. / Poisson, M. A. / Garcia, J. C. / Grattepain, C. / Mimila Arroyo, J. / Plana, R. / Bland, S. W.

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Title:

Hydrogen-related effects in GaInP/GaAs HBTs: incorporation, removal and influence on device reliability

Contributors:

Cassette, S. (author) / Delage, S. L. (author) / Chartier, E. (author) / Floriot, D. (author) / Poisson, M. A. (author) / Garcia, J. C. (author) / Grattepain, C. (author) / Mimila Arroyo, J. (author) / Plana, R. (author) / Bland, S. W. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 80 ; 279 - 283

Publication date:

2001-01-01

Size:

5 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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