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    Experimental Damage Mechanics of Microelectronics Solder Joints under Concurrent Vibration and Thermal Loading

    New search for: Basaran, C.
    New search for: Cartwright, A.
    New search for: Zhao, Y.

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    Experimental Damage Mechanics of Microelectronics Solder Joints under Concurrent Vibration and Thermal Loading

    New search for: Basaran, C.
    New search for: Cartwright, A.
    New search for: Zhao, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Experimental Damage Mechanics of Microelectronics Solder Joints under Concurrent Vibration and Thermal Loading

    New search for: Basaran, C.
    New search for: Cartwright, A.
    New search for: Zhao, Y.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Experimental Damage Mechanics of Microelectronics Solder Joints under Concurrent Vibration and Thermal Loading

    Contributors:

    Basaran, C. (author) / Cartwright, A. (author) / Zhao, Y. (author)

    Published in:

    INTERNATIONAL JOURNAL OF DAMAGE MECHANICS ; 10 ; 153-170

    Publication date:

    2001-01-01

    Size:

    18 pages

    ISSN:

    1056-7895

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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