Secondary ion measurements for oxygen cluster ion SIMS

Ninomiya, S. / Aoki, T. / Seki, T. et al. | British Library Online Contents | 2006

Critical distance for secondary ion formation: Experimental SIMS measurements

Kudriavtsev, Y. / Gallardo, S. / Villegas, A. et al. | British Library Online Contents | 2008

SIMS-AMS depth profiles for NASA Genesis samples: Preliminary measurements

Cetina, C. / Grabowski, K. S. / Knies, D. L. et al. | British Library Online Contents | 2008

XPS and SIMS/SNMS measurements on thin metal oxide layers

Albers, T. / Neumann, M. / Lipinsky, D. et al. | British Library Online Contents | 1993

XPS and SIMS/SNMS measurements on thin metal oxide layers

Albers, T. / Neumann, M. / Lipinsky, D. et al. | British Library Online Contents | 1993