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Critical distance for secondary ion formation: Experimental SIMS measurements

Kudriavtsev, Y. / Gallardo, S. / Villegas, A. / Ramirez, G. / Asomoza, R.

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Critical distance for secondary ion formation: Experimental SIMS measurements

Kudriavtsev, Y. / Gallardo, S. / Villegas, A. / Ramirez, G. / Asomoza, R.

Critical distance for secondary ion formation: Experimental SIMS measurements

Kudriavtsev, Y. / Gallardo, S. / Villegas, A. / Ramirez, G. / Asomoza, R.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Critical distance for secondary ion formation: Experimental SIMS measurements

Contributors:

Kudriavtsev, Y. (author) / Gallardo, S. (author) / Villegas, A. (author) / Ramirez, G. (author) / Asomoza, R. (author)

Published in:

APPLIED SURFACE SCIENCE ; 255 ; 877-879

Publication date:

2008-01-01

Size:

3 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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