A platform for research: civil engineering, architecture and urbanism
Transconductance, carrier mobility and 1/f noise in Si/Si0.64Ge0.36/Si pMOSFETs
Transconductance, carrier mobility and 1/f noise in Si/Si0.64Ge0.36/Si pMOSFETs
Transconductance, carrier mobility and 1/f noise in Si/Si0.64Ge0.36/Si pMOSFETs
Prest, M. J. (author) / Palmer, M. J. (author) / Grasby, T. J. (author) / Phillips, P. J. (author) / Mironov, O. A. (author) / Parker, E. H. (author) / Whall, T. E. (author) / Waite, A. M. (author) / Evans, A. G. (author) / Watling, J. R. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 89 ; 444 - 448
2002-01-01
5 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Comparative study of low frequency noise and hot-carrier reliability in SiGe PD SOI pMOSFETs
British Library Online Contents | 2008
|Mobility and performance enhancement in compressively strained SiGe channel PMOSFETs
British Library Online Contents | 2004
|The switch of the worst case on NBTI and hot-carrier reliability for 0.13mm pMOSFETs
British Library Online Contents | 2008
|Challenges and opportunities in advanced Ge pMOSFETs
British Library Online Contents | 2012
|High transconductance nitride MOSHFETs
British Library Online Contents | 2004
|