Photoluminescence Imaging and Wavelength Analysis of Basal Plane Frank-Type Defects in 4H-SiC Epilayers

Kamata, I. / Zhang, X. / Tsuchida, H. | British Library Online Contents | 2012

Basal Plane Dislocations in 4H-SiC Epilayers with Different Dopings

Zhang, X. / Nagano, M. / Tsuchida, H. | British Library Online Contents | 2012

Investigation of Basal Plane Dislocations in the 4H-SiC Epilayers Grown on {0001} Substrates

Tsuchida, H. / Miyanagi, T. / Kamata, I. et al. | British Library Online Contents | 2005

Performance of Silicon Carbide PiN Diodes Fabricated on Basal Plane Dislocation-Free Epilayers

Zhang, Z. H. / Grekov, A. E. / Sadagopan, P. et al. | British Library Online Contents | 2006

Spatial Profiling of Planar Defects in 4H-SiC Epilayers Using Micro-Photoluminescence Mapping

Feng, G. / Suda, J. / Kimoto, T. | British Library Online Contents | 2009