Nanocrystals depth profiling by means of Cs+ in negative polarity with dual beam ToF-SIMS: Fid-Bau Portal

Nanocrystals depth profiling by means of Cs+ in negative polarity with dual beam ToF-SIMS

Perego, M. / Ferrari, S. / Spiga, S. / Fanciulli, M.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Nanocrystals depth profiling by means of Cs+ in negative polarity with dual beam ToF-SIMS

Perego, M. / Ferrari, S. / Spiga, S. / Fanciulli, M.

Nanocrystals depth profiling by means of Cs+ in negative polarity with dual beam ToF-SIMS

Perego, M. / Ferrari, S. / Spiga, S. / Fanciulli, M.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Nanocrystals depth profiling by means of Cs+ in negative polarity with dual beam ToF-SIMS

Contributors:

Perego, M. (author) / Ferrari, S. (author) / Spiga, S. (author) / Fanciulli, M. (author)

Published in:

APPLIED SURFACE SCIENCE ; 203-204 ; 110-113

Publication date:

2003-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Similar titles

Ultra Shallow Depth Profiling with SIMS

Ehrke, H.-U. | British Library Online Contents | 2008

TOF-SIMS depth profiling of SIMON

Xin, G. / Dong, G. / Xu, C. et al. | British Library Online Contents | 2003

SIMS depth profiling of working environment nanoparticles

Konarski, P. / Iwanejko, I. / Mierzejewska, A. | British Library Online Contents | 2003

Depth distribution of Cs implanted into Si at steady-state during dual beam ToF-SIMS profiling

Vitchev, R. G. / Brison, J. / Houssiau, L. | British Library Online Contents | 2008

Accurate SIMS depth profiling for ultra-shallow implants using backside SIMS

Hongo, C. / Tomita, M. / Takenaka, M. et al. | British Library Online Contents | 2003