Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    SIMS depth profiling of working environment nanoparticles

    New search for: Konarski, P.
    New search for: Iwanejko, I.
    New search for: Mierzejewska, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    SIMS depth profiling of working environment nanoparticles

    New search for: Konarski, P.
    New search for: Iwanejko, I.
    New search for: Mierzejewska, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    SIMS depth profiling of working environment nanoparticles

    New search for: Konarski, P.
    New search for: Iwanejko, I.
    New search for: Mierzejewska, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    SIMS depth profiling of working environment nanoparticles

    Contributors:

    Konarski, P. (author) / Iwanejko, I. (author) / Mierzejewska, A. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 203-204 ; 757-761

    Publication date:

    2003-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Ultra Shallow Depth Profiling with SIMS

    Ehrke, H.-U. | British Library Online Contents | 2008

    TOF-SIMS depth profiling of SIMON

    Xin, G. / Dong, G. / Xu, C. et al. | British Library Online Contents | 2003

    SIMS depth profiling and TEM imaging of the SIMS altered layer

    Christofi, A. / Walker, J. F. / McPhail, D. S. | British Library Online Contents | 2008

    Accurate SIMS depth profiling for ultra-shallow implants using backside SIMS

    Hongo, C. / Tomita, M. / Takenaka, M. et al. | British Library Online Contents | 2003

    Ultralow-energy SIMS for shallow semiconductor depth profiling

    Chanbasha, A. R. / Wee, A. T. | British Library Online Contents | 2008

    Back to top