SIMS depth profiling of InGaAsN/InAlAs quantum wells on InP: Fid-Bau Portal

SIMS depth profiling of InGaAsN/InAlAs quantum wells on InP

Maier, M. / Serries, D. / Geppert, T. / Kohler, K. / Gullich, H. / Herres, N.

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SIMS depth profiling of InGaAsN/InAlAs quantum wells on InP

Maier, M. / Serries, D. / Geppert, T. / Kohler, K. / Gullich, H. / Herres, N.

SIMS depth profiling of InGaAsN/InAlAs quantum wells on InP

Maier, M. / Serries, D. / Geppert, T. / Kohler, K. / Gullich, H. / Herres, N.

Access

Access via TIB

Check availability in my library

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Document information

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Document information

Title:

SIMS depth profiling of InGaAsN/InAlAs quantum wells on InP

Contributors:

Maier, M. (author) / Serries, D. (author) / Geppert, T. (author) / Kohler, K. (author) / Gullich, H. (author) / Herres, N. (author)

Published in:

APPLIED SURFACE SCIENCE ; 203-204 ; 486-489

Publication date:

2003-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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