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SIMS depth profiling of InGaAsN/InAlAs quantum wells on InP
SIMS depth profiling of InGaAsN/InAlAs quantum wells on InP
SIMS depth profiling of InGaAsN/InAlAs quantum wells on InP
Maier, M. (author) / Serries, D. (author) / Geppert, T. (author) / Kohler, K. (author) / Gullich, H. (author) / Herres, N. (author)
APPLIED SURFACE SCIENCE ; 203-204 ; 486-489
2003-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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