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SIMS depth profiling and TEM imaging of the SIMS altered layer

Christofi, A. / Walker, J. F. / McPhail, D. S.

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SIMS depth profiling and TEM imaging of the SIMS altered layer

Christofi, A. / Walker, J. F. / McPhail, D. S.

SIMS depth profiling and TEM imaging of the SIMS altered layer

Christofi, A. / Walker, J. F. / McPhail, D. S.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

SIMS depth profiling and TEM imaging of the SIMS altered layer

Contributors:

Christofi, A. (author) / Walker, J. F. (author) / McPhail, D. S. (author)

Published in:

APPLIED SURFACE SCIENCE ; 255 ; 1381-1383

Publication date:

2008-01-01

Size:

3 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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