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Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces

Sommerhalter, C. / Glatzel, T. / Matthes, T. W. / Jager-Waldau, A. / Lux-Steiner, M. C.

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Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces

Sommerhalter, C. / Glatzel, T. / Matthes, T. W. / Jager-Waldau, A. / Lux-Steiner, M. C.

Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces

Sommerhalter, C. / Glatzel, T. / Matthes, T. W. / Jager-Waldau, A. / Lux-Steiner, M. C.

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Title:

Kelvin probe force microscopy in ultra high vacuum using amplitude modulation detection of the electrostatic forces

Contributors:

Sommerhalter, C. (author) / Glatzel, T. (author) / Matthes, T. W. (author) / Jager-Waldau, A. (author) / Lux-Steiner, M. C. (author)

Published in:

APPLIED SURFACE SCIENCE ; 157 ; 263-268

Publication date:

2000-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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