Kelvin probe force microscopy on III-V semiconductors: the effect of surface defects on the local work function: Fid-Bau Portal

Kelvin probe force microscopy on III-V semiconductors: the effect of surface defects on the local work function

Glatzel, T. / Sadewasser, S. / Shikler, R. / Rosenwaks, Y. / Lux-Steiner, M. C.

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Kelvin probe force microscopy on III-V semiconductors: the effect of surface defects on the local work function

Glatzel, T. / Sadewasser, S. / Shikler, R. / Rosenwaks, Y. / Lux-Steiner, M. C.

Kelvin probe force microscopy on III-V semiconductors: the effect of surface defects on the local work function

Glatzel, T. / Sadewasser, S. / Shikler, R. / Rosenwaks, Y. / Lux-Steiner, M. C.

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Check availability in my library

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Document information

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Document information

Title:

Kelvin probe force microscopy on III-V semiconductors: the effect of surface defects on the local work function

Contributors:

Glatzel, T. (author) / Sadewasser, S. (author) / Shikler, R. (author) / Rosenwaks, Y. (author) / Lux-Steiner, M. C. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 138-142

Publication date:

2003-01-01

Size:

5 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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