Correlation between Carrier Recombination Lifetime and Forward Voltage Drop in 4H-SiC PiN Diodes

Chung, G.Y. / Loboda, M.J. / Sundaresan, S.G. et al. | British Library Online Contents | 2010

The Role of Carrier Lifetime in Forward Bias Degradation of 4H-SiC PiN Diodes

Hefner, A. / McNutt, T. / Berning, D. et al. | British Library Online Contents | 2004

Investigation of surface recombination and carrier lifetime in 4H/6H-SiC

Galeckas, A. / Linnros, J. / Frischholz, M. et al. | British Library Online Contents | 1999

Wafer Level Recombination Carrier Lifetime Measurements of 4H-SiC PiN Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / MacMillan, M.F. et al. | British Library Online Contents | 2009

Investigation of Charge Carrier Lifetime Temperature-Dependence in 4H-SiC Diodes

Udal, A. / Velmre, E. | British Library Online Contents | 2007