Effect of temperature on the transfer characteristic of a 0.5 mm-gate Si:SiGe depletion-mode n-MODFET: Fid-Bau Portal

Effect of temperature on the transfer characteristic of a 0.5 mm-gate Si:SiGe depletion-mode n-MODFET

Gaspari, V. / Fobelets, K. / Velazquez-Perez, J. E. / Ferguson, R. / Michelakis, K. / Despotopoulos, S. / Papavassilliou, C.

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Effect of temperature on the transfer characteristic of a 0.5 mm-gate Si:SiGe depletion-mode n-MODFET

Gaspari, V. / Fobelets, K. / Velazquez-Perez, J. E. / Ferguson, R. / Michelakis, K. / Despotopoulos, S. / Papavassilliou, C.

Effect of temperature on the transfer characteristic of a 0.5 mm-gate Si:SiGe depletion-mode n-MODFET

Gaspari, V. / Fobelets, K. / Velazquez-Perez, J. E. / Ferguson, R. / Michelakis, K. / Despotopoulos, S. / Papavassilliou, C.

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Title:

Effect of temperature on the transfer characteristic of a 0.5 mm-gate Si:SiGe depletion-mode n-MODFET

Contributors:

Gaspari, V. (author) / Fobelets, K. (author) / Velazquez-Perez, J. E. (author) / Ferguson, R. (author) / Michelakis, K. (author) / Despotopoulos, S. (author) / Papavassilliou, C. (author)

Published in:

APPLIED SURFACE SCIENCE ; 224 ; 390-393

Publication date:

2004-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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