Characterisation of ultra-thin III/V-heterostructures by convergent-beam-electron- and high-resolution-X-ray-diffraction: Fid-Bau Portal

Characterisation of ultra-thin III/V-heterostructures by convergent-beam-electron- and high-resolution-X-ray-diffraction

Schulze-Kraasch, F. / Velling, P. / Neumann, S. / Prost, W.

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Characterisation of ultra-thin III/V-heterostructures by convergent-beam-electron- and high-resolution-X-ray-diffraction

Schulze-Kraasch, F. / Velling, P. / Neumann, S. / Prost, W.

Characterisation of ultra-thin III/V-heterostructures by convergent-beam-electron- and high-resolution-X-ray-diffraction

Schulze-Kraasch, F. / Velling, P. / Neumann, S. / Prost, W.

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Check availability in my library

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Document information

Title:

Characterisation of ultra-thin III/V-heterostructures by convergent-beam-electron- and high-resolution-X-ray-diffraction

Contributors:

Schulze-Kraasch, F. (author) / Velling, P. (author) / Neumann, S. (author) / Prost, W. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 110 ; 161-167

Publication date:

2004-01-01

Size:

7 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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