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Evaluation of BN-delta-doped multilayer reference materials for shallow depth profiling in SIMS: round-robin test
Evaluation of BN-delta-doped multilayer reference materials for shallow depth profiling in SIMS: round-robin test
Evaluation of BN-delta-doped multilayer reference materials for shallow depth profiling in SIMS: round-robin test
Toujou, F. (author) / Yoshikawa, S. (author) / Homma, Y. (author) / Takano, A. (author) / Takenaka, H. (author) / Tomita, M. (author) / Li, Z. (author) / Hasegawa, T. (author) / Sasakawa, K. (author) / Schuhmacher, M. (author)
APPLIED SURFACE SCIENCE ; 231/232 ; 649-652
2004-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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