Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    XPS analysis of carrier trapping phenomena in ultrathin SiO2 film formed on Si substrate

    New search for: Hirose, K.
    New search for: Kawashiri, S.
    New search for: Hattori, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    XPS analysis of carrier trapping phenomena in ultrathin SiO2 film formed on Si substrate

    New search for: Hirose, K.
    New search for: Kawashiri, S.
    New search for: Hattori, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    XPS analysis of carrier trapping phenomena in ultrathin SiO2 film formed on Si substrate

    New search for: Hirose, K.
    New search for: Kawashiri, S.
    New search for: Hattori, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    XPS analysis of carrier trapping phenomena in ultrathin SiO2 film formed on Si substrate

    Contributors:

    Hirose, K. (author) / Kawashiri, S. (author) / Hattori, T. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 234 ; 202-206

    Publication date:

    2004-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Characterization of dielectric properties of ultrathin SiO2 film formed on Si substrate

    Hirose, K. / Kitahara, H. / Hattori, T. | British Library Online Contents | 2003

    Analysis on interface states of ultrathin-SiO2/Si(111)

    Hasunuma, R. / Ando, A. / Miki, K. et al. | British Library Online Contents | 2000

    Thin Ag film formation onto Si/SiO2 substrate

    Iida, S. / Okui, T. / Tai, T. et al. | British Library Online Contents | 2000

    Magnetization reorientation induced by interfacial structures in ultrathin disordered FePt film sandwiched by SiO2 layers

    Yang, Guang / Zhang, Jing-Yan / Wang, Shou-Guo et al. | British Library Online Contents | 2015

    Ultrathin SiO2 layer formed by the nitric acid oxidation of Si (NAOS) method to improve the thermal-SiO2/Si interface for crystalline Si solar cells

    Matsumoto, Taketoshi / Nakajima, Hiroki / Irishika, Daichi et al. | British Library Online Contents | 2017

    Back to top