Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Surface potential mapping of biased pn junction with kelvin probe force microscopy: application to cross-section devices

    New search for: Doukkali, A.
    New search for: Ledain, S.
    New search for: Guasch, C.
    New search for: Bonnet, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Surface potential mapping of biased pn junction with kelvin probe force microscopy: application to cross-section devices

    New search for: Doukkali, A.
    New search for: Ledain, S.
    New search for: Guasch, C.
    New search for: Bonnet, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Surface potential mapping of biased pn junction with kelvin probe force microscopy: application to cross-section devices

    New search for: Doukkali, A.
    New search for: Ledain, S.
    New search for: Guasch, C.
    New search for: Bonnet, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Surface potential mapping of biased pn junction with kelvin probe force microscopy: application to cross-section devices

    Contributors:

    Doukkali, A. (author) / Ledain, S. (author) / Guasch, C. (author) / Bonnet, J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 235 ; 507-512

    Publication date:

    2004-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Surface Potential Mapping of SAM-Functionalized Organic Semiconductors by Kelvin Probe Force Microscopy

    Ellison, D. J. / Lee, B. / Podzorov, V. et al. | British Library Online Contents | 2011

    Kelvin Probe Force Microscopy of Molecular Surfaces

    Fujihira, M. | British Library Online Contents | 1999

    Kelvin probe force microscopy using near-field optical tips

    Shikler, R. / Rosenwaks, Y. | British Library Online Contents | 2000

    Measurements of electric potential in a laser diode by Kelvin Probe Force Microscopy

    Leveque, G. / Girard, P. / Skouri, E. et al. | British Library Online Contents | 2000

    Nanoscale interface mapping of a CdS-CZTS single nanorod heterojunction using Kelvin probe force microscopy

    Gupta, S. / Varandani, D. / Sharma, A. K. et al. | British Library Online Contents | 2015

    Back to top