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Differential Hall profiling of ultra-shallow junctions in Si and SOI
Differential Hall profiling of ultra-shallow junctions in Si and SOI
Differential Hall profiling of ultra-shallow junctions in Si and SOI
Bennett, N. S. (author) / Smith, A. J. (author) / Colombeau, B. (author) / Gwilliam, R. (author) / Cowern, N. E. (author) / Sealy, B. J. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 124-125 ; 305-309
2005-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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