The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy: Fid-Bau Portal

The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy

Smeeton, T. M. / Humphreys, C. J. / Barnard, J. S. / Kappers, M. J.

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The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy

Smeeton, T. M. / Humphreys, C. J. / Barnard, J. S. / Kappers, M. J.

The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy

Smeeton, T. M. / Humphreys, C. J. / Barnard, J. S. / Kappers, M. J.

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Check availability in my library

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Title:

The impact of electron beam damage on the detection of indium-rich localisation centres in InGaN quantum wells using transmission electron microscopy

Contributors:

Smeeton, T. M. (author) / Humphreys, C. J. (author) / Barnard, J. S. (author) / Kappers, M. J. (author)

Published in:

JOURNAL OF MATERIALS SCIENCE ; 41 ; 2729-2737

Publication date:

2006-01-01

Size:

9 pages

ISSN:

0022-2461

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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