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    Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films

    New search for: Dudley, M.
    New search for: Bai, J.
    New search for: Huang, X.
    New search for: Vetter, W. M.
    New search for: Dhanaraj, G.
    New search for: Raghothamachar, B.

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    Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films

    New search for: Dudley, M.
    New search for: Bai, J.
    New search for: Huang, X.
    New search for: Vetter, W. M.
    New search for: Dhanaraj, G.
    New search for: Raghothamachar, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films

    New search for: Dudley, M.
    New search for: Bai, J.
    New search for: Huang, X.
    New search for: Vetter, W. M.
    New search for: Dhanaraj, G.
    New search for: Raghothamachar, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Synchrotron white beam X-ray topography, transmission electron microscopy and high-resolution X-ray diffraction studies of defects and strain relaxation processes in wide band gap semiconductor crystals and thin films

    Contributors:

    Dudley, M. (author) / Bai, J. (author) / Huang, X. (author) / Vetter, W. M. (author) / Dhanaraj, G. (author) / Raghothamachar, B. (author)

    Published in:

    MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 9 ; 315-322

    Publication date:

    2006-01-01

    Size:

    8 pages

    ISSN:

    1369-8001

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.38152

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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