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Depth profiling using C60+ SIMS-Deposition and topography development during bombardment of silicon
Depth profiling using C60+ SIMS-Deposition and topography development during bombardment of silicon
Depth profiling using C60+ SIMS-Deposition and topography development during bombardment of silicon
Gillen, G. (author) / Batteas, J. (author) / Michaels, C. A. (author) / Chi, P. (author) / Small, J. (author) / Windsor, E. (author) / Fahey, A. (author) / Verkouteren, J. (author) / Kim, K. J. (author)
APPLIED SURFACE SCIENCE ; 252 ; 6521-6525
2006-01-01
5 pages
Article (Journal)
English
DDC:
621.35
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