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    Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

    New search for: Boschmans, B.
    New search for: Vanneste, M.
    New search for: Ruys, L.
    New search for: Temmerman, E.
    New search for: Leys, C.
    New search for: Van Vaeck, L.

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    Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

    New search for: Boschmans, B.
    New search for: Vanneste, M.
    New search for: Ruys, L.
    New search for: Temmerman, E.
    New search for: Leys, C.
    New search for: Van Vaeck, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

    New search for: Boschmans, B.
    New search for: Vanneste, M.
    New search for: Ruys, L.
    New search for: Temmerman, E.
    New search for: Leys, C.
    New search for: Van Vaeck, L.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Static secondary ion mass spectrometry (S-SIMS) analysis of atmospheric plasma treated polypropylene films

    Contributors:

    Boschmans, B. (author) / Vanneste, M. (author) / Ruys, L. (author) / Temmerman, E. (author) / Leys, C. (author) / Van Vaeck, L. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 6660-6663

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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