Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements

    New search for: Bardi, U.
    New search for: Chenakin, S. P.
    New search for: Lavacchi, A.
    New search for: Pagura, C.
    New search for: Tolstogouzov, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements

    New search for: Bardi, U.
    New search for: Chenakin, S. P.
    New search for: Lavacchi, A.
    New search for: Pagura, C.
    New search for: Tolstogouzov, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements

    New search for: Bardi, U.
    New search for: Chenakin, S. P.
    New search for: Lavacchi, A.
    New search for: Pagura, C.
    New search for: Tolstogouzov, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements

    Contributors:

    Bardi, U. (author) / Chenakin, S. P. (author) / Lavacchi, A. (author) / Pagura, C. (author) / Tolstogouzov, A. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 252 ; 7373-7382

    Publication date:

    2006-01-01

    Size:

    10 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Sputter Depth Profiling

    King, B. V. | Springer Verlag | 1992

    Deuterium concentration depth profiling in sputter-deposited tungsten coated F82H using secondary ion mass spectrometry

    Y. Xu / Y. Hirooka / L.M. Luo et al. | DOAJ | 2019

    Free access

    Method for sputter rate determination in sputter depth profiling

    Lopez, F. / Garcia-Cuenca, M. V. / Asensi, J. M. et al. | British Library Online Contents | 1993

    Method for sputter rate determination in sputter depth profiling

    Lopez, F. / Garcia-Cuenca, M. V. / Asensi, J. M. et al. | British Library Online Contents | 1993

    Sub-keV secondary ion mass spectrometry depth profiling: comparison of sample rotation and oxygen flooding

    Liu, R. / Wee, A. T. S. | British Library Online Contents | 2004

    Back to top