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Microstructure of flow pattern defects in boron-doped Czochralski-grown silicon

Liu, C. / Hao, Q. / Zhang, J.

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Microstructure of flow pattern defects in boron-doped Czochralski-grown silicon

Liu, C. / Hao, Q. / Zhang, J.

Microstructure of flow pattern defects in boron-doped Czochralski-grown silicon

Liu, C. / Hao, Q. / Zhang, J.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Microstructure of flow pattern defects in boron-doped Czochralski-grown silicon

Contributors:

Liu, C. (author) / Hao, Q. (author) / Zhang, J. (author)

Published in:

RARE METALS -BEIJING- ENGLISH EDITION ; 25 ; 389-392

Publication date:

2006-01-01

Size:

4 pages

ISSN:

1001-0521

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 669

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