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Ellipsometric characterization of nanocrystals in porous silicon
Ellipsometric characterization of nanocrystals in porous silicon
Ellipsometric characterization of nanocrystals in porous silicon
Petrik, P. (author) / Fried, M. (author) / Vazsonyi, E. (author) / Lohner, T. (author) / Horvath, E. (author) / Polgar, O. (author) / Basa, P. (author) / Barsony, I. (author) / Gyulai, J. (author)
APPLIED SURFACE SCIENCE ; 253 ; 200-203
2006-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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