Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Relaxation of strain in patterned strained silicon investigated by UV Raman spectroscopy

    New search for: Himcinschi, C.
    New search for: Radu, I.
    New search for: Singh, R.
    New search for: Erfurth, W.
    New search for: Milenin, A. P.
    New search for: Reiche, M.
    New search for: Christiansen, S. H.
    New search for: Gosele, U.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Relaxation of strain in patterned strained silicon investigated by UV Raman spectroscopy

    New search for: Himcinschi, C.
    New search for: Radu, I.
    New search for: Singh, R.
    New search for: Erfurth, W.
    New search for: Milenin, A. P.
    New search for: Reiche, M.
    New search for: Christiansen, S. H.
    New search for: Gosele, U.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Relaxation of strain in patterned strained silicon investigated by UV Raman spectroscopy

    New search for: Himcinschi, C.
    New search for: Radu, I.
    New search for: Singh, R.
    New search for: Erfurth, W.
    New search for: Milenin, A. P.
    New search for: Reiche, M.
    New search for: Christiansen, S. H.
    New search for: Gosele, U.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Relaxation of strain in patterned strained silicon investigated by UV Raman spectroscopy

    Contributors:

    Himcinschi, C. (author) / Radu, I. (author) / Singh, R. (author) / Erfurth, W. (author) / Milenin, A. P. (author) / Reiche, M. (author) / Christiansen, S. H. (author) / Gosele, U. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 135 ; 184-187

    Publication date:

    2006-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Strain relaxation in nano-patterned strained-Si/SiGe heterostructure on insulator

    Liu, X. / Liu, W. / Ma, X. et al. | British Library Online Contents | 2010

    Anodisation-related structural variations of porous silicon nanostructures investigated by photoluminescence and Raman spectroscopy

    Ben Younes, O. / Oueslati, M. / Bessais, B. | British Library Online Contents | 2003

    Laser crystallization of amorphous silicon films investigated by Raman spectroscopy and atomic force microscopy

    Jin, J. / Yuan, Z. / Huang, L. et al. | British Library Online Contents | 2010

    Observation of defects evolution in strained SiGe layers during strain relaxation

    Jang, J. H. / Phen, M. S. / Siebein, K. et al. | British Library Online Contents | 2009

    Strain determination around Vickers indentation on silicon surface by Raman spectroscopy

    Puech, P. / Demangeot, F. / Pizani, P. S. | British Library Online Contents | 2004

    Back to top