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Origin of Surface Morphological Defects in 4H-SiC Homoepitaxial Films
Origin of Surface Morphological Defects in 4H-SiC Homoepitaxial Films
Origin of Surface Morphological Defects in 4H-SiC Homoepitaxial Films
Okada, T. (author) / Okamoto, K. (author) / Ochi, K. (author) / Higashimine, K. (author) / Kimoto, T. (author) / Devaty, R. P. / Larkin, D. J. / Saddow, S. E.
2006-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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