Compositional contrast in AlxGa1-xN/GaN heterostructures using scanning spreading resistance microscopy: Fid-Bau Portal

Compositional contrast in AlxGa1-xN/GaN heterostructures using scanning spreading resistance microscopy

Fraser, I. S. / Oliver, R. A. / Sumner, J. / McAleese, C. / Kappers, M. J. / Humphreys, C. J.

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Compositional contrast in AlxGa1-xN/GaN heterostructures using scanning spreading resistance microscopy

Fraser, I. S. / Oliver, R. A. / Sumner, J. / McAleese, C. / Kappers, M. J. / Humphreys, C. J.

Compositional contrast in AlxGa1-xN/GaN heterostructures using scanning spreading resistance microscopy

Fraser, I. S. / Oliver, R. A. / Sumner, J. / McAleese, C. / Kappers, M. J. / Humphreys, C. J.

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Title:

Compositional contrast in AlxGa1-xN/GaN heterostructures using scanning spreading resistance microscopy

Contributors:

Fraser, I. S. (author) / Oliver, R. A. (author) / Sumner, J. (author) / McAleese, C. (author) / Kappers, M. J. (author) / Humphreys, C. J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 253 ; 3937-3944

Publication date:

2007-01-01

Size:

8 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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