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    Effect of high temperature storage test on reliability of eutectic Sn-Cu/ENIG solder joint

    New search for: Yoon, J.-W.
    New search for: Kim, S.-W.
    New search for: Jung, S.-B.

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    Effect of high temperature storage test on reliability of eutectic Sn-Cu/ENIG solder joint

    New search for: Yoon, J.-W.
    New search for: Kim, S.-W.
    New search for: Jung, S.-B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Effect of high temperature storage test on reliability of eutectic Sn-Cu/ENIG solder joint

    New search for: Yoon, J.-W.
    New search for: Kim, S.-W.
    New search for: Jung, S.-B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Effect of high temperature storage test on reliability of eutectic Sn-Cu/ENIG solder joint

    Contributors:

    Yoon, J.-W. (author) / Kim, S.-W. (author) / Jung, S.-B. (author)

    Published in:

    MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 23 ; 411-416

    Publication date:

    2007-01-01

    Size:

    6 pages

    ISSN:

    0267-0836

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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