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Stress-Assisted Atomic Migration in Thin Copper Films
Stress-Assisted Atomic Migration in Thin Copper Films
Stress-Assisted Atomic Migration in Thin Copper Films
Hanabusa, T. (author) / Kusaka, K. (author) / Kaneko, K. (author) / Sakata, O. (author) / Nishida, M. (author) / Zhou, Y. / Tu, S.-T. / Xie, X.
2007-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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