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High-Resolution Topography Analysis on Threading Edge Dislocations in 4H-SiC Epilayers
High-Resolution Topography Analysis on Threading Edge Dislocations in 4H-SiC Epilayers
High-Resolution Topography Analysis on Threading Edge Dislocations in 4H-SiC Epilayers
Kamata, I. (author) / Nagano, M. (author) / Tsuchida, H. (author) / Chen, Y. (author) / Dudley, M. (author)
MATERIALS SCIENCE FORUM ; 600/603 ; 305-308
2009-01-01
4 pages
Article (Journal)
English
DDC:
620.11
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