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X-ray photoelectron spectroscopy study of NiSi formation on shallow junctions
X-ray photoelectron spectroscopy study of NiSi formation on shallow junctions
X-ray photoelectron spectroscopy study of NiSi formation on shallow junctions
Jiang, Y. L. (author) / Ru, G. P. (author) / Qu, X. P. (author) / Li, B. Z. (author)
APPLIED SURFACE SCIENCE ; 256 ; 698-701
2009-01-01
4 pages
Article (Journal)
English
DDC:
621.35
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