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Nanoscale electrical characterization of ultrathin high-k dielectric MOS stacks: A conducting AFM study
Nanoscale electrical characterization of ultrathin high-k dielectric MOS stacks: A conducting AFM study
Nanoscale electrical characterization of ultrathin high-k dielectric MOS stacks: A conducting AFM study
Uppal, H.J. (author) / Bernardini, S. (author) / Efthymiou, E. (author) / Volkos, S.N. (author) / Dimoulas, A. (author) / Markevich, V. (author) / Hamilton, B. (author) / Peaker, A.R. (author)
MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 11 ; 250-253
2008-01-01
4 pages
Article (Journal)
English
DDC:
621.38152
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