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Electrical characterization of defects introduced during metallization processes in n-type germanium

Auret, F.D. / Coelho, S.M.M. / van Rensburg, P.J.J. / Nyamhere, C. / Meyer, W.E.

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Electrical characterization of defects introduced during metallization processes in n-type germanium

Auret, F.D. / Coelho, S.M.M. / van Rensburg, P.J.J. / Nyamhere, C. / Meyer, W.E.

Electrical characterization of defects introduced during metallization processes in n-type germanium

Auret, F.D. / Coelho, S.M.M. / van Rensburg, P.J.J. / Nyamhere, C. / Meyer, W.E.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Electrical characterization of defects introduced during metallization processes in n-type germanium

Contributors:

Auret, F.D. (author) / Coelho, S.M.M. (author) / van Rensburg, P.J.J. (author) / Nyamhere, C. (author) / Meyer, W.E. (author)

Published in:

MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING ; 11 ; 348-353

Publication date:

2008-01-01

Size:

6 pages

ISSN:

1369-8001

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.38152

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