Influence of Shockley Stacking Fault Generation on Electrical Behavior of 4H-SiC 10 kV MPS Diodes: Fid-Bau Portal

Influence of Shockley Stacking Fault Generation on Electrical Behavior of 4H-SiC 10 kV MPS Diodes

Zhang, Q.C. / Agarwal, A. / Burk, A.A. / O Loughlin, M.J. / Palmour, J. / Stahlbush, R.E. / Scozzie, C.

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Influence of Shockley Stacking Fault Generation on Electrical Behavior of 4H-SiC 10 kV MPS Diodes

Zhang, Q.C. / Agarwal, A. / Burk, A.A. / O Loughlin, M.J. / Palmour, J. / Stahlbush, R.E. / Scozzie, C.

Influence of Shockley Stacking Fault Generation on Electrical Behavior of 4H-SiC 10 kV MPS Diodes

Zhang, Q.C. / Agarwal, A. / Burk, A.A. / O Loughlin, M.J. / Palmour, J. / Stahlbush, R.E. / Scozzie, C.

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Title:

Influence of Shockley Stacking Fault Generation on Electrical Behavior of 4H-SiC 10 kV MPS Diodes

Contributors:

Zhang, Q.C. (author) / Agarwal, A. (author) / Burk, A.A. (author) / O Loughlin, M.J. (author) / Palmour, J. (author) / Stahlbush, R.E. (author) / Scozzie, C. (author) / Bauer, A.J. / Friedrichs, P. / Krieger, M.

Published in:

Silicon Carbide and Related Materials 2009 ; 331-334

MATERIALS SCIENCE FORUM ; 645/648

Publication date:

2010-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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Overlapping Shockley/Frank Faults in 4H-SiC PiN Diodes

Twigg, M. E. / Stahlbush, R. E. / Losee, P. A. et al. | British Library Online Contents | 2006

Observation of Shrinking and Reformation of Shockley Stacking Faults by PL Mapping

Miyanagi, T. / Tsuchida, H. / Kamata, I. et al. | British Library Online Contents | 2006

Characterization of Stacking Fault-Induced Behavior in 4H-SiC p-i-n Diodes

Wang, Y. / Chen, L. / Mikhov, M. K. et al. | British Library Online Contents | 2006