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    On the influence of the surface roughness onto the ultrathin SiO2/Si structure properties

    New search for: Jureka, S.
    New search for: Kobayashi, H.
    New search for: Takahashi, M.
    New search for: Matsumoto, T.
    New search for: Jurekova, M.
    New search for: Chovanec, F.
    New search for: Pinik, E.

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    On the influence of the surface roughness onto the ultrathin SiO2/Si structure properties

    New search for: Jureka, S.
    New search for: Kobayashi, H.
    New search for: Takahashi, M.
    New search for: Matsumoto, T.
    New search for: Jurekova, M.
    New search for: Chovanec, F.
    New search for: Pinik, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    On the influence of the surface roughness onto the ultrathin SiO2/Si structure properties

    New search for: Jureka, S.
    New search for: Kobayashi, H.
    New search for: Takahashi, M.
    New search for: Matsumoto, T.
    New search for: Jurekova, M.
    New search for: Chovanec, F.
    New search for: Pinik, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    On the influence of the surface roughness onto the ultrathin SiO2/Si structure properties

    Contributors:

    Jureka, S. (author) / Kobayashi, H. (author) / Takahashi, M. (author) / Matsumoto, T. (author) / Jurekova, M. (author) / Chovanec, F. (author) / Pinik, E. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 256 ; 5623-5628

    Publication date:

    2010-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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