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    Nano-Pattern Recognition and Correlation Technique for Sub-Nanometer In-Plane Displacement Measurement

    New search for: Bi, H.
    New search for: Jang, C.
    New search for: Han, B.

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    Nano-Pattern Recognition and Correlation Technique for Sub-Nanometer In-Plane Displacement Measurement

    New search for: Bi, H.
    New search for: Jang, C.
    New search for: Han, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nano-Pattern Recognition and Correlation Technique for Sub-Nanometer In-Plane Displacement Measurement

    New search for: Bi, H.
    New search for: Jang, C.
    New search for: Han, B.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Nano-Pattern Recognition and Correlation Technique for Sub-Nanometer In-Plane Displacement Measurement

    Contributors:

    Bi, H. (author) / Jang, C. (author) / Han, B. (author)

    Published in:

    EXPERIMENTAL MECHANICS ; 50 ; 1169-1181

    Publication date:

    2010-01-01

    Size:

    13 pages

    ISSN:

    0014-4851

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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