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Structural and optical properties study of nanocrystalline Si (nc-Si) thin films deposited on porous aluminum by plasma enhanced chemical vapor deposition

Ghrib, M. / Gaidi, M. / Khedher, N. / Ghrib, T. / Salem, M. B. / Ezzaouia, H.

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Structural and optical properties study of nanocrystalline Si (nc-Si) thin films deposited on porous aluminum by plasma enhanced chemical vapor deposition

Ghrib, M. / Gaidi, M. / Khedher, N. / Ghrib, T. / Salem, M. B. / Ezzaouia, H.

Structural and optical properties study of nanocrystalline Si (nc-Si) thin films deposited on porous aluminum by plasma enhanced chemical vapor deposition

Ghrib, M. / Gaidi, M. / Khedher, N. / Ghrib, T. / Salem, M. B. / Ezzaouia, H.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Structural and optical properties study of nanocrystalline Si (nc-Si) thin films deposited on porous aluminum by plasma enhanced chemical vapor deposition

Contributors:

Ghrib, M. (author) / Gaidi, M. (author) / Khedher, N. (author) / Ghrib, T. (author) / Salem, M. B. (author) / Ezzaouia, H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 257 ; 3998-4003

Publication date:

2011-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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