Radiation-induced defects in different silicon (111) wafers by 400 keV electron irradiation: Fid-Bau Portal

Radiation-induced defects in different silicon (111) wafers by 400 keV electron irradiation

Gao, H. / Wang, H. / Yuan, Y.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Radiation-induced defects in different silicon (111) wafers by 400 keV electron irradiation

Gao, H. / Wang, H. / Yuan, Y.

Radiation-induced defects in different silicon (111) wafers by 400 keV electron irradiation

Gao, H. / Wang, H. / Yuan, Y.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Radiation-induced defects in different silicon (111) wafers by 400 keV electron irradiation

Contributors:

Gao, H. (author) / Wang, H. (author) / Yuan, Y. (author)

Published in:

RARE METALS -BEIJING- ENGLISH EDITION ; 31 ; 290-295

Publication date:

2012-01-01

Size:

6 pages

ISSN:

1001-0521

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 669

Reiche, M. / Tong, Q.-Y. / Goesele, U. et al. | British Library Online Contents | 1995

Electrical characteristics of oxygen precipitation related defects in Czochralski silicon wafers

Kirscht, F. G. / Furukawa, Y. / Seifert, W. et al. | British Library Online Contents | 1996

Annealing of radiation-induced defects in silicon

Gaidar, G. P. | British Library Online Contents | 2012

The engineering of intrinsic point defects in silicon wafers and crystals

Falster, R. / Voronkov, V. V. | British Library Online Contents | 2000

Simple Method for Mapping Optical Defects in Insulating Silicon Carbide Wafers

Mier, M. / Boeckl, J. / Roth, M. et al. | British Library Online Contents | 2003