Influence of Structural Defects on Carrier Lifetime in 4H Epitaxial Layers, Studied by High Resolution Optical Lifetime Mapping

Hassan, J. / Bergman, J.P. | British Library Online Contents | 2009

Identification of Defects Limiting the Carrier Lifetime in n^- Epitaxial Layers of 4H-SiC

Klein, P.B. | British Library Online Contents | 2010

Minority Carrier Lifetime Measurements in Specific Epitaxial 4H-SiC Layers by the Microwave Photoconductivity Decay

Ottaviani, L. / Palais, O. / Barakel, D. et al. | British Library Online Contents | 2009

Carrier Generation Lifetime in 4H-SiC Epitaxial Wafers

Chung, G.Y. / Loboda, M.J. / Marninella, M.J. et al. | British Library Online Contents | 2009

CL/EBIC-SEM Techniques for Evaluation of Impact of Crystallographic Defects on Carrier Lifetime in 4H-SiC Epitaxial Layers

Maximenko, S.I. / Freitas, J.A. / Picard, Y.N. et al. | British Library Online Contents | 2010