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    Critical Density of Nanoscale Pits for Suppressing Variability in Leakage Current of a SiC Schottky Barrier Diode

    New search for: Ishikawa, T.
    New search for: Katsuno, T.
    New search for: Watanabe, Y.
    New search for: Fujiwara, H.
    New search for: Endo, T.

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    Critical Density of Nanoscale Pits for Suppressing Variability in Leakage Current of a SiC Schottky Barrier Diode

    New search for: Ishikawa, T.
    New search for: Katsuno, T.
    New search for: Watanabe, Y.
    New search for: Fujiwara, H.
    New search for: Endo, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Critical Density of Nanoscale Pits for Suppressing Variability in Leakage Current of a SiC Schottky Barrier Diode

    New search for: Ishikawa, T.
    New search for: Katsuno, T.
    New search for: Watanabe, Y.
    New search for: Fujiwara, H.
    New search for: Endo, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
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    Document information
    Title:

    Critical Density of Nanoscale Pits for Suppressing Variability in Leakage Current of a SiC Schottky Barrier Diode

    Contributors:

    Ishikawa, T. (author) / Katsuno, T. (author) / Watanabe, Y. (author) / Fujiwara, H. (author) / Endo, T. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 717/720 ; 371-374

    Publication date:

    2012-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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